System and method for diagnosing and validating a machine using waveform data

US6643799B1 · kind B1 · utility

Assignee

• General Electric Company · US

Inventors

• Piero Patrone Bonissone · Schenectady, US
• Yu-To Chen · Pleasanton, US
• Vipin Kewal Ramani · Niskayuna, US
• Rasiklal Punjalal Shah · Latham, US
• John Andrew Johnson · Delafield, US
• Phillip Edward Steen · Delafield, US
• Ramesh Ramachandran · Niskayuna, US

Key dates

• Filing date: May 3, 2000
• Grant date: Nov 4, 2003
• Expiry date: May 3, 2020

Classification

• Technology area (CPC G): Physics
• CPC primary: G16H40/40
• WIPO field: Medical technology
• WIPO sector: Instruments

Abstract

A system and method for diagnosing and validating a machine with waveform data generated therefrom. Historical waveform data are obtained from machines having known faults along with corresponding actions for repairing the machines and are used to develop fault classification rules. The fault classification rules are stored in a diagnostic knowledge database. The database of classification rules are used to diagnose new waveform data from a machine having an unknown fault.