Patent · US Expired

On-line measurement system for product formed in a continuous manner and method therefor

US6644121B2 · kind B2 · utility

0Cited by
12References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 24, 2001
Grant dateNov 11, 2003
Priority date
Expiry dateDec 28, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2291/02854
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An improvement in an on-line measurement system for product formed in a continuous manner includes a device for receiving a first waveform signal indicative of a presence of a first characteristic of the product and a second waveform signal indicative of a presence of a second characteristic of the product. A computer based device having phase shifting software is provided for shifting phase of each of the first waveform signal and the second waveform signal a predetermined amount to produce a respective first transformed waveform signal and a second transformed waveform signal. Further, software is provided in the computer based device for combining the first waveform signal and the first transformed waveform signal in manner to produce a first rectified waveform having an increasingly defined peak and for combining the second waveform signal and the second transformed waveform signal in manner to produce a second rectified waveform having an increasingly defined peak, wherein the peaks are useful in the in-line measurement system for defining a third characteristic of the product. A method employing the invention is also provided.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.