Patent · US Expired

Selective solder bump application

US6645841B2 · kind B2 · utility

3Cited by
1References
22Claims
0Family size

Assignee

Inventor

Key dates

Filing dateNov 16, 2001
Grant dateNov 11, 2003
Priority date
Expiry dateNov 16, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/3011
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Selective application of solder bumps in an integrated circuit package. Solder bumps are selectively applied in a solder bump integrated circuit packaging process so that portions of a circuit can be effectively disabled. The bumps may be selectively applied either to a die or to the substrate using multiple solder masks, one for each pattern of solder bumps desired or can be otherwise applied in multiple patterns depending upon which portions of the circuitry are to be active and which are to be disabled.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.