Patent · US Expired

Test needle for pattern adapter of circuit board tester

US6646457B2 · kind B2 · utility

1Cited by

8References

26Claims

0Family size

Assignee

atg test systems GmbH & Co. KG · DE

Inventors

Bernd Ott · Künzelsau, DE
Manfred Prokopp · Wertheim, DE

Key dates

Filing date	Feb 21, 2002
Grant date	Nov 11, 2003
Priority date	—
Expiry date	Feb 21, 2022

Classification

Technology area (CPC H)Electricity
CPC primaryH01R13/22
WIPO fieldElectrical machinery, apparatus, energy
WIPO sectorElectrical engineering

Abstract

The test needle has, for contacting a circuit board test point, a contact portion configured conically tapered to a free contact tip. The contact portion has a length of at least 15 mm and at the contact tip a diameter smaller than 0.2 mm. An end section of the contact portion apposite the contact tip comprises a diameter at least 0.1 mm larger than the contact tip. With the test needle in accordance with the invention, extremely dense structures on circuit boards can be strobed. The test needle in accordance with the invention is stiffer than known test needles for strobing comparable structures. This simplifies their handling and the configuration of a pattern adapter incorporating these test needles.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.