Patent · US Expired

Creep testing fixture and method

US6647802B2 · kind B2 · utility

9Cited by
4References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 29, 2001
Grant dateNov 18, 2003
Priority date
Expiry dateMar 29, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2203/0071
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A creep testing fixture and method for applying a precise amount of constant tensile stress to a creep test specimen to allow for precise measurement of creep in the test specimen. The fixture includes first and second mounting grips for holding opposite ends of a test specimen. A frame supports the mounting grips for relative reciprocal movement toward and away from each other. A tensile spring is connected between the first and second mounting grips. The frame subjects a test specimen held between the mounting grips to tensile stress in response to axially inward force that the tensile spring applies to the frame.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.