Creep testing fixture and method
US6647802B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 29, 2001 |
| Grant date | Nov 18, 2003 |
| Priority date | — |
| Expiry date | Mar 29, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2203/0071
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A creep testing fixture and method for applying a precise amount of constant tensile stress to a creep test specimen to allow for precise measurement of creep in the test specimen. The fixture includes first and second mounting grips for holding opposite ends of a test specimen. A frame supports the mounting grips for relative reciprocal movement toward and away from each other. A tensile spring is connected between the first and second mounting grips. The frame subjects a test specimen held between the mounting grips to tensile stress in response to axially inward force that the tensile spring applies to the frame.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.