Patent · US Expired

Apparatus and method for thin film deposition onto substrates

US6649208B2 · kind B2 · utility

43Cited by
6References
20Claims
0Family size

Inventor

Key dates

Filing dateApr 16, 2002
Grant dateNov 18, 2003
Priority date
Expiry dateMay 15, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/6715
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An apparatus for depositing thin films on a plurality of substrates has a vacuum chamber, a source of the material or materials to be deposited as the thin film, a source of energy for causing the material to be vaporized, and mechanical apparatus for imparting super-planetary and planetary motion to each substrate while the substrate is exposed to the vapors of the material. When a predetermined thickness of the film on any given substrate is reached the super-planetary motion is halted and only planetary motion and spinning are continued for the given substrate. During this process the thickness of the film being deposited is monitored accurately by an optical instrument having a linear axis of measurement which coincides with the center of the orbiting planetary motion of the substrate and is on the substrate itself.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.