Ion monitoring
US6649916B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 4, 2002 |
| Grant date | Nov 18, 2003 |
| Priority date | — |
| Expiry date | Jun 4, 2022 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J47/02
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
The apparatus and method provide a technique for significantly reducing capacitance effects in detector electrodes arising due to movement of the instrument relative to the item/location being monitored in ion detection based techniques. The capacitance variations are rendered less significant by placing an electrically conducting element between the detector electrodes and the monitored location/item. Improved sensitivity and reduced noise signals arise as a result. The technique also provides apparatus and method suitable for monitoring elongate items which are unsuited to complete enclosure in one go within a chamber. The items are monitored part by part as the pass through the instrument, so increasing the range of items or locations which can be successfully monitored.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.