Patent · US Expired

Solid-state image sensor of a MOS structure

US6649948B2 · kind B2 · utility

10Cited by
8References
5Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMay 6, 2002
Grant dateNov 18, 2003
Priority date
Expiry dateMay 6, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10F39/807

Abstract

In a MOS type solid-state image sensor having an image pickup area formed at a semiconductor substrate and comprising a two-dimensional array of row and column unit cells including a photoelectric conversion section and signal scanning circuit, a first p well area is provided in a surface portion of an n type silicon substrate and a second p well area is selectively provided in the surface portion of the first p well area and is higher in p type impurity concentration than the first p well area. In the image pickup area, the photoelectric conversion section is formed in the first p well area and the signal scanning circuit section is formed in the second p well area.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.