Method and apparatus for temperature control of a device during testing
US6650132B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jul 19, 2002 |
| Grant date | Nov 18, 2003 |
| Priority date | — |
| Expiry date | Jul 19, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05D23/2401
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for controlling the temperature of a DUT during a testing operation, includes a) measuring a parameter related to power consumption by the DUT during testing, such as current consumption; and b) using the parameter related to power consumption to operate a temperature control device to compensate for temperature change due to changes in power consumption by the DUT during testing. The control can be closed loop or open loop with control signals incorporated into a test program. Apparatus for controlling the temperature of a DUT during testing, includes a) a device for measuring a parameter related to power consumption by the DUT during testing; b) a temperature control device which operates to control the temperature of the DUT during test; and c) a device for controlling operation of the temperature control device according to the measured parameter related to power consumption.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.