Method for calibrating spectrophotometric apparatus
US6651015B2 · kind B2 · utility
Inventor
Key dates
| Filing date | Sep 30, 2002 |
| Grant date | Nov 18, 2003 |
| Priority date | — |
| Expiry date | Sep 30, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/2866
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Described is a method for determining the concentration of an analyte in a future sample that is measured on a second apparatus. This method involves incorporating, in a second apparatus, at least one primary calibration algorithm that is developed using absorbances of samples from a primary calibration set. The absorbances, which are optionally pre-processed prior to primary calibration algorithm development, are obtained from one or more first apparatus. The absorbance values of the future sample are measured on the second apparatus at one or more than one wavelength from a standard set of wavelengths, and a concentration of the analyte in the future sample is calculated by applying the Primary Calibration Algorithm to the optionally pre-processed absorbance of the future sample obtained from the second apparatus.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.