Patent · US Expired

Contact apparatus particularly useful with test equipment

US6652326B2 · kind B2 · utility

18Cited by
6References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 11, 2001
Grant dateNov 25, 2003
Priority date
Expiry dateJul 11, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01R2103/00
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A double-ended, coaxial contact assembly has a center probe rod (12) mounted in the bore of a dielectric center spacer bushing (16) and mounts a probe contact assembly on each end of the center probe rod. The center probe rod is received in a ground sleeve (19) with the probe contact assemblies maintained in coaxial relationship with the ground sleeve by a dielectric outer spacer bushing (17). In certain embodiments a movable ground plunger (18g,22) is slidably received in each end of the ground sleeves and biased outwardly by respective ground plunger coil springs (25). In one such embodiment the center spacer bushing (16′) is provided with an axially extending sleeve disposed between the respective probe contact assembly and the ground sleeve.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.