Patent · US Expired

Scanning microscope with multiband illumination and optical component for a scanning microscope with multiband illumination

US6654166B2 · kind B2 · utility

8Cited by

5References

18Claims

0Family size

Assignee

Leica Microsystems Heidelberg GmbH · DE

Inventors

Holger Birk · Meckesheim, DE
Rafael Storz · Heidelberg, DE
Johann Engelhardt · Bad Schönborn, DE

Key dates

Filing date	Jun 15, 2001
Grant date	Nov 25, 2003
Priority date	—
Expiry date	Aug 2, 2021

Classification

Technology area (CPC H)Electricity
CPC primaryH01S3/1636
WIPO fieldOptics
WIPO sectorInstruments

Abstract

A scanning microscope is disclosed, through which a sample (14) can be illuminated and detected. An illumination pinhole and a detection pinhole (10, 16) are respectively arranged in the illumination beam path and in the detection beam path (8, 15), an optical component (4), which generates at least to some extent spectrally broadened illumination light, is provided in the illumination beam path (8). A polarization-independent and wavelength-independent beam splitter (11) is arranged in a fixed position in the illumination beam path and the detection beam path (8, 15).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.