Patent · US Expired

Method for conducting analysis of two-dimensional images

US6654490B2 · kind B2 · utility

7Cited by
16References
14Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 27, 2001
Grant dateNov 25, 2003
Priority date
Expiry dateAug 27, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/30176
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method of enhancing a source image for analysis. The method comprises the steps of digitizing the source image to obtain pixel data comprising location data and density data, generating a three-dimensional model of the pixel data with the location data represented in first and second axes and the density data represented in a third axis, and analyzing the three-dimensional model to determine features of the source image.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.