Patent · US Expired

Semiconductor manufacturing apparatus and manufacturing method for thin film semiconductor device

US6657154B1 · kind B1 · utility

33Cited by
20References
1Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 30, 1997
Grant dateDec 2, 2003
Priority date
Expiry dateMay 30, 2017

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/908
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

In a manufacturing technology for forming a thin film transistor comprising a laser irradiation step, objects of the present invention are to obtain a high performance and multifunction semiconductor manufacturing apparatus and thin film transistor manufacturing method. A silicon thin film 201 is formed on a glass substrate 202, and laser 203 is irradiated onto this thin film 201 whereby a re-crystallization film is obtained. This re-crystallization film undergoes a hydrogen plasma processing so that dangling-bonds of silicon are terminated. Moreover, a step for forming a silicon dioxide film 205 on the re-crystallization film is included. These steps are performed under the conditions that the glass substrate 202 is not exposed to the air and a processing temperature is 350° C. or less.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.