Pattern detector for capturing images with reduced distortion
US6657185B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 29, 2000 |
| Grant date | Dec 2, 2003 |
| Priority date | — |
| Expiry date | Mar 31, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06K7/10683
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An irregular pattern detector includes a first optical system, a transparent light guide body and a second optical system. The first optical system has a light source. The transparent light guide body has an incident face receiving incident light from the light source of the first optical system, a detection face facing the incident face for placing of a subject having an irregular pattern, a curved surface reflecting scattered light from the detection face, an optical absorbing face facing the curved surface and having an opening outputting light reflected from the curved surface. The second optical system, such as an imaging lens, guides the light from the opening of the optical absorbing face of the transparent light guide body to a camera device. This irregular pattern detector can be scaled down, and can produced precise images without any deformation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.