Methods and systems for measuring local scattering and aberration properties of optical media
US6659613B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Mar 27, 2001 |
| Grant date | Dec 9, 2003 |
| Priority date | — |
| Expiry date | Mar 27, 2021 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B3/1015
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
Methods, systems, and media relating the display of scattering and/or absorption characteristics of an optical medium. For scattering measurements, a Hartmann-Shack calibration image of a measurement system is acquired to define a first plurality of point spread functions. A Hartmann-Shack test image of the medium is acquired to define a second plurality of point spread functions. A shift is determined between the test image and the calibration image. A point spread of each of the second plurality of point spread functions is measured, each of the second plurality of point spread functions including a component due to optical aberration of the medium and a component due to scatter. The component due to optical aberration is determined using the shift. The component due to optical aberration is deconvolved to determine the component due to scatter. A display of the local scattering characteristics is generated using the component due to scatter. For absorption measurements, a plurality of spot intensity measurements are acquired of a medium, each spot intensity measurement including a component due to reflectivity and a component due to absorption. The component due to reflectivity …
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.