Patent · US Expired

Method of testing for response abnormalities in a magnetic sensor

US6661223B2 · kind B2 · utility

1Cited by
10References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 7, 2002
Grant dateDec 9, 2003
Priority date
Expiry dateJan 7, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11B2005/3996
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

A method is disclosed for determining the presence of response abnormalities in magnetic sensors. The method includes placing the sensor in an applied magnetic field and collecting sensor resistance information as the magnitude and direction of the applied field is altered. The resistance values are then examined to determine the presence of response abnormalities.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.