Method and apparatus for enabling extests to be performed in AC-coupled systems
US6662134B2 · kind B2 · utility
6Cited by
5References
20Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Nov 1, 2001 |
| Grant date | Dec 9, 2003 |
| Priority date | — |
| Expiry date | Jul 3, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318572
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus are provided for enabling a Joint Test Access Group (JTAG)-type EXTEST to be performed in an alternating current (AC)-coupled system in order to test one or more AC-coupled connections on a printed circuit board (PCB). Direct current (DC)-restore logic receives an AC-coupled signal that corresponds to an EXTEST test pattern output from a transmitting JTAG-compliant integrated circuit (IC), and converts the AC-coupled signal into a DC signal suitable for use by JTAG logic of a JTAG-compliant receiving IC.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.