Patent · US Expired

Automated diagnostic metric loop

US6662171B1 · kind B1 · utility

8Cited by
4References
12Claims
0Family size

Assignee

Inventor

Key dates

Filing dateOct 30, 2000
Grant dateDec 9, 2003
Priority date
Expiry dateJul 1, 2022

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S707/99953
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A computer system that collects diagnostic information from diagnostic software as well as knowledgepath information about the path a user uses in searching a knowledgebase and provides this information electronically to a call center where the information is stored in a database along with a textual description of the problem. Correlation software analyzes data from multiple incidents to correlate the multiple incidents into common problem definitions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.