Patent · US Expired

Automated diagnostic tester for HID lamp luminaires

US6664790B2 · kind B2 · utility

2Cited by
4References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 27, 2001
Grant dateDec 16, 2003
Priority date
Expiry dateJan 7, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/44
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

In an embodiment of the present invention, an automated diagnostic tester system is configured for use with a lighting fixture connected to a power source and including at least one of a ballast connected to the power source, a capacitor connected to the ballast, an ignitor, and a high intensity discharge lamp connected to the ballast. The tester system includes an electrical connector system capable of being interconnected as part of the lighting fixture, providing circuit access at least to the power source and to the high intensity discharge lamp. This enables interruption of at least one of (i) the connection of the ballast to the power source and (ii) the connection of the high intensity discharge lamp to the ballast. An automated diagnostic tester is connected to the electrical connector system and is operable to automatically measure lighting fixture parameters including at least at one of power source voltage, ballast open circuit output voltage, ballast output current, ignitor pulse voltage and lamp operating voltage.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.