Patent · US Expired

Method and apparatus for reducing average power in RAMs by dynamically changing the bias on PFETs contained in memory cells

US6665227B2 · kind B2 · utility

73Cited by
2References
40Claims
0Family size

Assignee

Inventor

Key dates

Filing dateOct 24, 2001
Grant dateDec 16, 2003
Priority date
Expiry dateJul 31, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2207/2227
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A circuit for reducing power in SRAMS and DRAMS is implemented by dynamically controlling a voltage applied to Nwells containing PFETs used in memory cells. When a memory cell is in standby, the voltage applied to Nwells containing PFETs is increased in order to reduce leakage current. When a memory cell is being written, read, or refreshed, the voltage applied to Nwells containing PFETs is reduced in order to allow the memory cell to switch more quickly.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.