Patent · US Expired

Load testing apparatus, computer readable recording medium for recording load test program, fault diagnosis apparatus, and computer readable recording medium for recording fault diagnosis program

US6665268B1 · kind B1 · utility

28Cited by
4References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 25, 2000
Grant dateDec 16, 2003
Priority date
Expiry dateFeb 25, 2020

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY04S40/00
  • WIPO fieldDigital communication
  • WIPO sectorElectrical engineering

Abstract

In a load testing apparatus, before the load test, three processor elements are combined, without overage or shortage, with a source processor element and a destination processor element as one pair, and the transmission time between the processor elements for each pair is measured. During the load test, packets are sent at a time from the source processor element to the corresponding destination processor element in the same pair, and the transmission time for each pair is measured. The transmission time measured for each pair in the load test is compared with a corresponding expected value data so as to evaluate the performance.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.