Method of estimating elastic and compositional parameters from seismic and echo-acoustic data
US6665615B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 26, 2001 |
| Grant date | Dec 16, 2003 |
| Priority date | — |
| Expiry date | Jun 10, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V1/306
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for determining from measured reflection data on a plurality of trace positions, a plurality of subsurface parameters. The method includes the steps of: preprocessing the measured reflection data into a plurality of partial or full stacks; specifying one or more initial subsurface parameters defining an initial subsurface model; specifying a wavelet or wavelet field for each of the partial or full stacks of the measured reflection data; calculating synthetic reflection data based on the specified wavelets and the initial subsurface parameters; optimizing an objective function, including the weighted difference between measured reflection data and synthetic reflection data for a plurality of trace positions simultaneously; and outputting the optimized subsurface parameters. A device for implementing this method is also included.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.