Method and apparatus for evaluating and correcting the tester derating factor (TDF) in a test environment
US6665627B2 · kind B2 · utility
8Cited by
8References
27Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 30, 2001 |
| Grant date | Dec 16, 2003 |
| Priority date | — |
| Expiry date | Jul 19, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/319
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Tester derating factor (TDF) arrangements and methodologies providing improvements in semiconductor start-to-finish manufacturing arrangements, especially within DV testing and in the world of designing of devices and virtual simulation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.