Patent · US Expired

Data capture and analysis for embedded systems

US6665819B1 · kind B1 · utility

2Cited by
7References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 24, 2000
Grant dateDec 16, 2003
Priority date
Expiry dateApr 24, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/3698
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Data capture and analysis for debugging embedded systems is disclosed. On a target, there is at least one data collector, each of which publishes predetermined data of the target, and a collection manager for managing the data collectors. On a host, there is at least one viewer, each of subscribes to the predetermined data of a data collector, for processing thereof, and a viewer manager for managing the viewers. Data collectors and viewers can be added, such that an extensible data capture and analysis embedded system architecture is provided.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.