Patent · US Expired

Method and apparatus for forming deposited film

US6667240B2 · kind B2 · utility

17Cited by
7References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 8, 2001
Grant dateDec 23, 2003
Priority date
Expiry dateJul 20, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH05H1/4622
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

A method for forming a deposited film, comprising generating plasma in a plurality of successive vacuum containers and continuously forming a deposited film on a belt-like substrate while continuously moving the substrate in its longitudinal direction, wherein an opening of a discharge container is adjusted with an opening adjusting plate having a shape set so as to reduce ununiformity of a deposited film thickness in a width direction of the substrate on the basis of a measurement of a deposition rate distribution. Accordingly, there is provided a method and an apparatus for forming a deposited film which are capable of producing a photovoltaic element without ununiformity in characteristics by depositing semiconductor layers without ununiformity in thickness and quality.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.