Method and device for measuring and quantifying surface defects on a test surface
US6667800B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 17, 1999 |
| Grant date | Dec 23, 2003 |
| Priority date | — |
| Expiry date | Aug 17, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/303
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Method and apparatus for measuring and quantifying surface finishing defects on a coated opaque test surface including utilizing at least one light source, at least one camera, and a central unit that has image analysis capability. At least two partial images are recorded with the camera while illuminating the opaque test surface using the light source. The two partial images are produced from the test surface by differing the angle of incident light for different partial images. The two partial images are processed by the central unit thereby establishing a difference image that is analyzed to quantify the degree of surface finishing defects on the coated opaque test surface. Optionally, the central unit further has operational control capabilities over at least one of the light sources and camera.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.