System and method for self-referencing calibration
US6667802B2 · kind B2 · utility
24Cited by
7References
22Claims
0Family size
Assignee
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Key dates
| Filing date | Feb 5, 2002 |
| Grant date | Dec 23, 2003 |
| Priority date | — |
| Expiry date | Jun 1, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/2866
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of calibrating a spectrographic inspection system, comprises providing a plurality of packages, each of the plurality of packages containing a group of items, wherein each of the groups of items has a known composition, measuring the reflectance value of each of the groups of items and thereby obtaining a reference reflectance value set, normalizing the reference reflectance value set and thereby creating a normalized reference reflectance value set, and storing the normalized reference reflectance value set.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.