Multifunctional fourier transform infrared spectrometer system

US6667808B2 · kind B2 · utility

Assignee

• THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC · US

Inventors

• Todd Clermont · DeForest, US
• Francis J. Deck · London, US
• Louie Delaware · Middleton, US
• James Hyatt · Kinnelon, US
• George Douglas Jones · Deerfield, US
• Gabor John Kemeny · Budapest, HU
• Steven Ralph Lowry · Madison, US
• William J. McCarthy · Madison, US
• John R. O'Keefe · Madison, US

Key dates

• Filing date: Feb 20, 2001
• Grant date: Dec 23, 2003
• Expiry date: Dec 28, 2021

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N2021/3595
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A multifunctional infrared spectrometer system has an interferometer which receives the infrared beam from a source and provides a modulated output beam on beam paths to multiple spatially separated infrared detectors. A multi-position mirror element mounted at a junction position receives the beam on a main beam path and directs it on branch beam paths to sample positions, with the beam then being directed on the branch beam path to one of the detectors. One of the branch beam paths may include a sample holder at the sample position which can index between a position at which a sample is analyzed, to a reference material position, to a pass-through position for calibration purposes. The multi-position mirror element may also be indexed to direct the beam on a branch path to a fiber optic cable which has a probe at the end of it which may be inserted in a sample fluid or powder to be analyzed, with the reflected light from the probe being directed back on an optical fiber cable to a detector at the spectrometer. The multi-position mirror element may be moved to a position at which the beam is directed on a beam path to and through an integrating sphere to a solid sample, with the r…