Patent · US Expired

Computer readable medium for performing sensor array based materials characterization

US6668230B2 · kind B2 · utility

44Cited by
96References
39Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 10, 2002
Grant dateDec 23, 2003
Priority date
Expiry dateDec 10, 2022

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC40B40/18
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A modular materials characterization apparatus includes a sensor array disposed on a substrate, with a standardized array and contact pad format; electronic test and measurement apparatus for sending electrical signals to and receiving electrical signals from the sensor array; an apparatus for making electrical contact to the sensors in the standardized array format; an apparatus for routing signals between one or more selected sensors and the electronic test and measurement apparatus and a computer including a computer readable having a computer program recorded therein for controlling the operator of the apparatus. The sensor array is preferably arranged in a standardized format used in combinatorial chemistry applications for rapid deposition of sample materials on the sensor array. The interconnection apparatus and sensor array and contact pad allow measurement of many different material properties by using substrates carrying different sensor types, with only minor modifications if any to the electronic test and measurement apparatus and test procedures. By using a sensor array that is separate from the electronic apparatus, and by including standardized contacting and signal …

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.