Patent · US Expired

Integrated circuit having photodiode device and associated fabrication process

US6670657B2 · kind B2 · utility

2Cited by
2References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 11, 2002
Grant dateDec 30, 2003
Priority date
Expiry dateJan 11, 2022

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02E10/50

Abstract

An integrated circuit is provided that includes a substrate incorporating a semiconductor photodiode device having a p-n junction. The photodiode device includes at least one capacitive trench buried in the substrate and connected in parallel with the junction. In a preferred embodiment, the substrate is formed from silicon, and the capacitive trench includes an internal doped silicon region partially enveloped by an insulating wall that laterally separates the internal region from the substrate. Also provided is a method for fabricating an integrated circuit including a substrate that incorporates a semiconductor photodiode device having a p-n junction.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.