Optical current measuring for high voltage systems
US6670799B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | May 3, 2000 |
| Grant date | Dec 30, 2003 |
| Priority date | — |
| Expiry date | May 3, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R15/246
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and/or apparatus for measuring current in a high voltage (HV) current carrier generates a low voltage signal proportional to the current in the HV carrier and applies this signal to an integrated-optic voltage sensor located in the HV environment adjacent to the HV current carrier to produce a modulated optical signal representative of the current being measured. The optical signal from the integrated-optic voltage sensor is conducted to a low voltage (LV) environment insulated from said HV environment and processed to provide a second electrical signal. One of the electrical signals is integrated so that an output signal of the required accuracy is available form the system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.