Method for determining the position and rotational position of an object
US6671058B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 21, 2000 |
| Grant date | Dec 30, 2003 |
| Priority date | — |
| Expiry date | Sep 1, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01C15/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to a method for determining the spatial and rotational positions of an object. With the assistance of an imaging optical system, the object is mapped and detected on a high-sensitivity resolution optoelectronic detector. The location parameter of the object, such as the position vector ({overscore (r)}0), the direction vector ({overscore (&ngr;)}) of the object axis, and the angle (&kgr;) of rotation of the object around the object axis is determined from the planar position of the mapped object structures in the coordinate system (XDet, YDet) of the detector by means of geometric optical relationships and mathematical evaluation methods. With this, the spatial position of the object is determined in a quick and contactless manner.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.