Reflective measuring scale graduation and method for its manufacture
US6671092B2 · kind B2 · utility
5Cited by
4References
28Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Mar 8, 2001 |
| Grant date | Dec 30, 2003 |
| Priority date | — |
| Expiry date | Aug 23, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01D5/34707
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A reflective measuring scale graduation, as well as a method for manufacturing the same are described. The reflective measuring scale graduation includes first and second subdivisions having different reflection properties, which extend in at least one first direction on a reflecting substrate. The highly reflecting first subdivisions are made of a plurality of partial layers having different indices of refraction and function as an interference filter. The low reflecting second subdivisions are composed of at least one absorber layer on the substrate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.