Patent · US Expired

Power MOS transistor with overtemperature protection circuit

US6671152B1 · kind B1 · utility

10Cited by
5References
2Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 5, 2001
Grant dateDec 30, 2003
Priority date
Expiry dateJan 5, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A power MOS transistor having a PMT chip located in a transistor housing in which the temperature of the transistor barrier junction is monitored is described. Protection of the PMT chip against overload and permanent damage is guaranteed without negatively affecting its switching function in that a protective circuit is provided in the transistor housing which directly measures the temperature of the transistor barrier junction using a temperature measuring element, and when a predefined or predefinable limit barrier junction temperature is reached reduces the drain current and thus the power loss of the PMT chip, the temperature measuring element being integrated in the PMT chip or accommodated in the transistor housing together with the protective circuit as an additional chip.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.