Micro compliant interconnect apparatus for integrated circuit devices
US6674297B1 · kind B1 · utility
10Cited by
14References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 9, 2002 |
| Grant date | Jan 6, 2004 |
| Priority date | — |
| Expiry date | Jul 9, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/07314
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A micro compliant, test probe interconnect apparatus for an integrated circuit device is disclosed. In an exemplary embodiment, the apparatus includes an elongated housing and a probe pin extending from a first end of the housing. A biasing mechanism holds the probe pin in a normally extended position, wherein the biasing mechanism is formed from a portion of the elongated housing. In a preferred embodiment, the biasing mechanism is a flexible tab, formed from a generally rectangular section of the elongated housing and bent inwardly therein to form a cantilever.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.