Method and apparatus for optical time domain reflectometry (OTDR) analysis
US6674518B1 · kind B1 · utility
34Cited by
3References
8Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 1, 2002 |
| Grant date | Jan 6, 2004 |
| Priority date | — |
| Expiry date | Jul 1, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M11/3109
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention is directed to a method and apparatus for testing a fiber-optic cable. An Optical Time Domain Reflectometer (OTDR) is presented. Test signals are generated from the OTDR and received by the OTDR for processing. The received test signals are sampled and analyzed. The received test signals include reflectance spikes and a slope. A first-order derivative is taken of the received signal. The first-order derivative is then filtered to remove the reflectance spikes and the slope. Discontinuities in the filtered first-order derivative denote a fault in the fiber-optic cable.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.