Optical method and system for rapidly measuring relative angular alignment of flat surfaces
US6674521B1 · kind B1 · utility
7Cited by
12References
26Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 12, 2000 |
| Grant date | Jan 6, 2004 |
| Priority date | — |
| Expiry date | May 12, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/26
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A reconfigurable optical method and system for rapidly measuring relative angular alignment of flat surfaces are provided. The method and system can be used to rapidly and simultaneously measure the relative angular alignment of machined flat surfaces of a manufactured part. The system can measure parallelism, perpendicularity or angular alignment of multiple flat surfaces. The system can also be used to set up a range of reference angles to which machined surfaces can be compared.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.