Monobit-run frequency on-line randomness test
US6675113B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 26, 2002 |
| Grant date | Jan 6, 2004 |
| Priority date | — |
| Expiry date | Aug 2, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F7/58
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present invention is a method and apparatus for testing the random numbers generated by a random number generator in real time. A stream of random bits is generated using said random number generator, then the generated random bits undergo a monobit-run length operation in which a plurality of sub-sequences having one of all 0's or all 1's bits in a row is identified. The output of said monobit-run length calculation is applied to an exponential averaging to obtain an average number of occurrences or frequencies for a range of monobit-run lengths. The monobit-run length frequencies are compared to predetermined acceptance ranges, so that if any of the average monobit-run frequency values falls repeatedly outside the predetermined acceptance range more than a predetermined number of times, it is determined that the generated random bits are insufficiently random.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.