LSI communication device with automatic test capability
US6675332B1 · kind B1 · utility
3Cited by
4References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 20, 2000 |
| Grant date | Jan 6, 2004 |
| Priority date | — |
| Expiry date | Feb 8, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/24
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A communication LSI device includes a state machine section and a test control section. The state machine section carries out a configuration operation in an idle state in response to a first reset signal. The state machine section changes to the idle state after completion of the configuration operation. The state machine section outputs a flag signal after a predetermined time since the state machine section changes to the idle state. The test control section outputs one the first reset signal to the state machine section in a test mode in response to the flag signal or a second reset signal externally supplied.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.