Method and system for inspecting optical devices
US6677591B1 · kind B1 · utility
5Cited by
34References
22Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jan 30, 2002 |
| Grant date | Jan 13, 2004 |
| Priority date | — |
| Expiry date | Apr 20, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10048
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for detecting defects in an optical device. The method includes obtaining an optical device that is a component of an optical communications system carrying information signals at a communications wavelength. Infrared light is applied to the optical device. The infrared light has a wavelength corresponding to the communications wavelength. An image of the optical device is obtained while the optical device is transmitting the infrared light. The image provides multidimensional data including positional values and intensity values. The image is then analyzed to detect defects in the optical device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.