Patent · US Expired

Material segregation, density, and moisture analyzing apparatus and method

US6677763B2 · kind B2 · utility

27Cited by
6References
20Claims
0Family size

Assignees

Inventor

Key dates

Filing dateMay 30, 2002
Grant dateJan 13, 2004
Priority date
Expiry dateMay 30, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R27/04
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A material analyzing apparatus and associated method for analyzing. The apparatus comprises an analyzer body that contains a generally insulative material casing; a material analyzing circuitry that includes a transmitter, a receiver, and a control; an antenna system that includes a transmitting antenna, a receiving antenna, and a ground layer; a coupling structure that couples the antenna system to the material analyzing circuitry. The transmitter of the material analyzing circuitry generates a electromagnetic wave signal that is adapted to be sent by the transmitting antenna and directed into the material to be analyzed. The receiving antenna receiving any returned signal from the material and send the returned signal to the receiver and control. The control then analyzes the signal for material characteristics, including at least one of density, material segregation, and moisture.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.