Device and method of reducing ESD damage in thin film read heads which enables measurement of gap resistances and method of making
US6678127B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 2, 2001 |
| Grant date | Jan 13, 2004 |
| Priority date | — |
| Expiry date | Nov 11, 2021 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/49078
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A first read gap layer has a resistance RG1 between a first shield layer and one of the first and second lead layers of a read head and the second read gap layer has a resistance RG2 between a second shield layer and said one of the first and second lead layers of the read head. A connection is provided via a plurality of resistors between a first node and each of the first and second shield layers wherein the plurality of resistors includes at least first and second resistors RS1 and RS2 and the first node is connected to said one of the first and second lead layers. A second node is located between the first and second resistors RS1 and RS2. An operational amplifier has first and second inputs connected to the first and second nodes respectively so as to be across the first resistor RS1 and has an output connected to the first node for maintaining the first and second nodes at a common voltage potential. In a first embodiment the first and second shield layers are shorted together. A test instrument is then employed for determining the combined parallel resistance of the resistors RS1 and RS2 by having a first side of the test instrument connected to the first node and the second…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.