Thickness measurement system and method
US6678634B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 27, 2001 |
| Grant date | Jan 13, 2004 |
| Priority date | — |
| Expiry date | Jun 5, 2021 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB21B38/04
- WIPO fieldMachine tools
- WIPO sectorMechanical engineering
Abstract
A system and method for frequent and accurate measuring of flat sheet thickness on a process line is disclosed. The results of the monitoring process of the present invention may be used to adjust the production process to better remain within predetermined tolerances. Data collection, data analysis, and process control are accomplished using a plurality of software applications in communication with various devices and equipment that support these functions of the present invention. A source/dectector unit collects data during the production process. The data is transmitted, manipulated, analyzed, and compared for conformance to tolerances and error signal output is transmitted to a process control system used to control the production process. If the sheet product is outside a specified tolerance range, an operator may also be notified so that corrective actions can be taken. Software applications may be used by an operator to perform setup and configuration operations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.