Scanning heat flow probe
US6679625B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 17, 2001 |
| Grant date | Jan 20, 2004 |
| Priority date | — |
| Expiry date | Dec 24, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K17/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A scanning heat flow probe for making quantitative measurements of heat flow through a device under test is provided. In one embodiment the scanning heat flow probe includes an electric current conductor in a cantilever beam connected to a probe tip and coupled to two voltmeter leads. The probe also includes two thermocouple junctions in the cantilever beam electrically isolated from the electric current conductor and the two voltmeter leads. Heat flow is derived quantitatively using only voltage and current measurements. In other forms, the invention relates to the calibration of scanning heat flow probes through a method involving interconnected probes, and relates to the minimization of heat flow measurement uncertainty by probe structure design practices.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.