Frequency domain analysis system for a time domain measurement instrument
US6681191B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 13, 2000 |
| Grant date | Jan 20, 2004 |
| Priority date | — |
| Expiry date | May 28, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R13/345
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A frequency domain analysis system incorporated into time domain measurement instrument has duration and resolution controls that respectively adjust the acquisition time intervals of a waveform record in seconds and adjusts the number of digital data samples over a specified duration. The duration of the acquisition waveform may be controlled using the duration control adjustment, a sample rate adjustment and a record length adjustment. The resolution controls concurrently adjusts the sample rate and the record length of the acquisition waveform while maintaining the duration constant. A movable and variable length frequency spectrum gate is applied to the digital data samples of the acquired waveform. A window filter is applied to the digital data samples within the gated region a spectrum analysis generator generates frequency domain values over the gates waveform record. The spectrum analysis generator outputs frequency domain values defined by frequency span and center frequency controls associated with spectrum analysis generator.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.