Patent · US Expired

Fabrication facility cycle time approximation method employing historic work in process (WIP) cycle time correlation

US6684118B2 · kind B2 · utility

3Cited by
10References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 14, 2002
Grant dateJan 27, 2004
Priority date
Expiry dateJul 9, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06Q10/0633
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

Within a method for approximating a cycle time for fabricating a microelectronic fabrication within a microelectronic fabrication facility there is first determined from historic data for fabrication of the microelectronic fabrication within the microelectronic fabrication facility a constant which correlates previous microelectronic fabrication loadings and cycle times within the microelectronic fabrication facility. The correlating constant may then be employed for approximating a cycle time for a future work in process (WIP) quantity of the microelectronic fabrication within the microelectronic fabrication facility.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.