Patent · US Expired

Reliability assessment and prediction system and method for implementing the same

US6684349B2 · kind B2 · utility

103Cited by
6References
33Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 18, 2001
Grant dateJan 27, 2004
Priority date
Expiry dateJul 11, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/008
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A system and method for reliability assessment and prediction of end items is provided herein. A reliability assessment program (RAP) in accordance with the present invention provides a reliability assessment of the new equipment and/or parts designed for in-field use by assessing the similarities and differences between the new equipment and the predecessor equipment. Predecessor end item field failure data is collected and analyzed to compare the degree of similarity between the predecessor fielded end item and the new design. Based on this comparison, an appropriate method of assessment is determined, for example, a similarity analysis process or a failure cause model. Both methods use models for comparison and generate an appropriate report expressing the failure rate prediction of the new design and/or the mean-time-between-failure (MTBF).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.