Patent · US Expired

System and method for diagnosing errors in multidimensional digital frame structure communications

US6684351B1 · kind B1 · utility

28Cited by
12References
31Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 22, 2000
Grant dateJan 27, 2004
Priority date
Expiry dateMar 16, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04L2001/0097
  • WIPO fieldDigital communication
  • WIPO sectorElectrical engineering

Abstract

A system and method is provided for in situ testing of communications links employing digitally wrapped communications. Portions of the payload to be wrapped are replaced with test patterns. These test patterns can be sent simultaneously with real information. The invention provides that the receiving node generate a test pattern, extract the transmitted test pattern, and determine errors in response to comparing the two test patterns. Analysis of the errors can be used to determine the state of the link between the transmitting and receiving nodes.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.