Procedure arrangement and sensor for testing of the H-F tightness of the junction between two adjacent parts

US6686748B2 · kind B2 · utility

Assignee

• Schroff GmbH · DE

Inventors

• Peter Reiser · Jeffery Road, DE
• Robert Benko · Neuenbürg, DE
• Hans-Martin Schwenk · Wiesenweg, DE

Key dates

• Filing date: Apr 4, 2002
• Grant date: Feb 3, 2004
• Expiry date: Apr 7, 2022

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R29/0878
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Arrangement to test HF tightness of a junction between two adjacent parts including HF generator (4), HF line that guides the signal over junction (1), measuring device (10) as well as a signal analyzer. HF line includes two waveguides (5a, 5b) that have inner conductors (6a, 6b) connected all the way through by a connection conductor (9) and outer conductors (7a, 7b) interrupted and each connected with electrodes (8a, 8b). A capacitive coupling of the HF signal occurs on one side of the junction and a capacitive decoupling of the HF signal takes place on the other side. By comparing the measured transmission and/or reflection of the HF signal with a transmission or reflection characteristic for the junction, it can be determined if the junction is HF tight. This makes it possible to test HF shielded cases for HF tightness in a non-destructive manner and without interfering with the contents.